The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Mar. 27, 2024
Applicant:

Orbotech Ltd., Yavne, IL;

Inventors:

Elkana Porat, Yavne, IL;

Ronen Yogev, Hulda, IL;

Nava Shpaisman, Yavne, IL;

Assignee:

Orbotech Ltd., Yavne, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/956 (2006.01); G01J 5/00 (2022.01); G01J 5/48 (2022.01); G01N 21/17 (2006.01); G01N 21/88 (2006.01); G01N 21/95 (2006.01); G01N 25/72 (2006.01);
U.S. Cl.
CPC ...
G01N 25/72 (2013.01); G01J 5/48 (2013.01); G01J 5/485 (2022.01); G01N 21/171 (2013.01); G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G01N 21/9505 (2013.01); G01N 21/95607 (2013.01); G01N 21/95684 (2013.01); G01J 2005/0077 (2013.01); G01N 2021/1714 (2013.01); G01N 2021/8835 (2013.01); G01N 2021/8864 (2013.01); G01N 2021/95638 (2013.01); G01N 2201/1042 (2013.01);
Abstract

The system includes a thermal subsystem, an optical subsystem, and a processor. The thermal subsystem comprises a first laser light source configured to emit laser light, a first focusing lens configured to direct the laser light onto a workpiece, and a thermal camera configured to capture a thermal image of the workpiece. The optical subsystem includes at least one light source configured to emit laser light with at least one illumination modality, at light focusing lens configured to direct the light onto the workpiece, and a detector configured to capture at least one image of the workpiece. The processor is configured to compare the at least one image received from the detector to at least one reference image for registration of the workpiece or to determine presence of a surface defect on the workpiece, and to determine presence of a bulk defect in the workpiece based on the thermal image.


Find Patent Forward Citations

Porat, Elkana. (2026). Method and apparatus for inspection of panel embedded dies using combined thermal and optical imaging (U.S. Patent No. 12644851). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12644851

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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