Nissim Elmaliah

Title: Nissim Elmaliah: Innovator in Charged Particle Systems

Introduction

Nissim Elmaliah is a prominent inventor based in Raanana, Israel, known for his contributions to the field of charged particle systems. With a total of four patents to his name, Elmaliah has made significant advancements in the technology surrounding charged particle beam focusing and inspection systems.

Latest Patents

One of Elmaliah's latest patents is focused on a charged particle beam focusing apparatus. This innovative device includes a charged particle beam generator that projects both non-astigmatic and astigmatic charged particle beams onto a specimen's surface. The apparatus is designed to capture released electrons and form images, allowing for precise adjustments to the focus of the non-astigmatic beam based on the analysis of the astigmatic beam's image.

Another notable patent is for a charged particle multi-beam inspection system. This system utilizes a beam generator to direct multiple primary charged particle beams onto an object, creating an array of beam spots. The system is equipped with detection elements that generate signals upon electron incidence, and it features imaging optics that enhance the detection process. The multi-aperture plate design allows for efficient operation by selecting different groups of apertures for beam traversal.

Career Highlights

Throughout his career, Nissim Elmaliah has worked with leading companies in the field, including Applied Materials Israel Limited and Carl Zeiss Microscopy GmbH. His experience in these organizations has contributed to his expertise in charged particle technologies and has facilitated his innovative work.

Collaborations

Elmaliah has collaborated with notable professionals in his field, including Rainer K. Knippelmeyer and Thomas Kemen. These collaborations have likely enriched his research and development efforts, leading to the successful patents he holds today.

Conclusion

Nissim Elmaliah's work in charged particle systems exemplifies the impact of innovation in technology. His patents reflect a commitment to advancing the capabilities of charged particle beam applications, making significant contributions to the field.