Company Filing History:
Years Active: 1993-2006
Title: The Innovative Contributions of Miyuki Matsuya
Introduction
Miyuki Matsuya is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of charged-particle optics, holding a total of 7 patents. Her work focuses on enhancing the precision and efficiency of charged particle beam instruments.
Latest Patents
Matsuya's latest patents include a groundbreaking charged-particle optical system designed to achieve optimum aberration correction. This system allows for the focusing of a beam of charged particles onto a specimen's surface. It features four stages of multipole elements arranged along the optical axis, along with power supplies that can provide five or more independent octopole electric or magnetic potentials. Additionally, the system includes a control portion that corrects third-order aperture aberrations by adjusting these potentials independently. Another notable patent is her charged particle beam instrument, which reduces the spread of the probe diameter while maintaining a constant probe current. This instrument utilizes a detection aperture to create a feedback signal, which is then supplied to the condenser lens control and objective lens control to ensure the charged particle probe remains in focus.
Career Highlights
Miyuki Matsuya has established herself as a key figure in her field through her innovative work at Jeol Ltd. Her expertise in charged-particle optics has positioned her as a leader in developing advanced imaging technologies.
Collaborations
Matsuya has collaborated with notable colleagues, including Kazuhiro Honda and Fumio Hosokawa, contributing to the advancement of their shared research interests.
Conclusion
Miyuki Matsuya's contributions to the field of charged-particle optics are invaluable. Her innovative patents and collaborative efforts continue to push the boundaries of technology in this area.