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Yokosuka, Japan

Mitsuaki Uesugi

USPTO Granted Patents = 13

Average Co-Inventor Count = 4.0

ph-index = 7

Forward Citations = 205(Granted Patents)

Location History:

Yokohama, JP (1985 - 1987)
Kanagawa, JP (1989 - 1992)
Tokyo, JP (1989 - 2003)
Yokosuka, JP (2007 - 2009)

Company Filing History:

Nkk Corporation

Nippon Kokan Kabushiki Kaisha

Years Active: 1985-2009

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13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7599052 - Method for marking defect and device therefor (2009-10-06),

2. 7423744 - Method for marking defect and device therefor (2008-09-09),

3. 7248366 - Method for marking defect and device therefor (2007-07-24),

4. 6559931 - Three-dimensional (3-D) coordinate measuring method, 3-D coordinate measuring apparatus, and large-structure building method (2003-05-06),

5. 5129268 - Method of measuring average particle size of granular material (1992-07-14),

6. 5104227 - Apparatus for measuring three-dimensional curved surface shapes (1992-04-14),

7. 5102224 - Apparatus for measuring three-dimensional curved surface shapes (1992-04-07),

8. 5102223 - Method and apparatus for measuring a three-dimensional curved surface (1992-04-07),

9. 4881126 - Image composing apparatus (1989-11-14),

10. 4874955 - Method and apparatus for measuring a three-dimensional curved surface (1989-10-17),

11. 4848912 - Apparatus for measuring a shape (1989-07-18),

12. 4716459 - Fatigue crack position detection apparatus (1987-12-29),

13. 4544268 - Method and apparatus for detecting flaw on threads of male screw (1985-10-01),

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