The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Oct. 24, 2006
Mitsuaki Uesugi, Yokosuka, JP;
Shoji Yoshikawa, Hachioji, JP;
Masaichi Inomata, Yokohama, JP;
Tsutomu Kawamura, Tokyo, JP;
Takahiko Oshige, Kawasaki, JP;
Hiroyuki Sugiura, Yokohama, JP;
Akira Kazama, Yokohama, JP;
Tsuneo Suyama, Fukuyama, JP;
Yasuo Kushida, Fukuyama, JP;
Shuichi Harada, Fukuyama, JP;
Hajime Tanaka, Fukuyama, JP;
Osamu Uehara, Fukuyama, JP;
Shuji Kaneto, Hiroshima, JP;
Masahiro Iwabuchi, Fukuyama, JP;
Kozo Harada, Fukuyama, JP;
Shinichi Tomonaga, Fukuyama, JP;
Shigemi Fukuda, Fukuyama, JP;
Mitsuaki Uesugi, Yokosuka, JP;
Shoji Yoshikawa, Hachioji, JP;
Masaichi Inomata, Yokohama, JP;
Tsutomu Kawamura, Tokyo, JP;
Takahiko Oshige, Kawasaki, JP;
Hiroyuki Sugiura, Yokohama, JP;
Akira Kazama, Yokohama, JP;
Tsuneo Suyama, Fukuyama, JP;
Yasuo Kushida, Fukuyama, JP;
Shuichi Harada, Fukuyama, JP;
Hajime Tanaka, Fukuyama, JP;
Osamu Uehara, Fukuyama, JP;
Shuji Kaneto, Hiroshima, JP;
Masahiro Iwabuchi, Fukuyama, JP;
Kozo Harada, Fukuyama, JP;
Shinichi Tomonaga, Fukuyama, JP;
Shigemi Fukuda, Fukuyama, JP;
NKK Corporation, Tokyo, JP;
Abstract
A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.