Fukuyama, Japan

Tsuneo Suyama

This inventor holds 3 USPTO granted patents. Top assignee: Nkk Corporation. Active years: 2007-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsuneo Suyama. Retrieved from https://idiyas.com/inventor/tsuneo-suyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 17.0

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2007-2009

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3 patents (USPTO):Explore Patents

Title: **Innovative Contributions of Tsuneo Suyama in the Field of Defect Marking Technology**

Introduction

Tsuneo Suyama is an esteemed inventor based in Fukuyama, Japan, recognized for his significant contributions in the field of defect marking technology. With a total of three patents to his name, his work has proven vital in enhancing inspection processes within industrial applications.

Latest Patents

One of Tsuneo Suyama's notable patents is titled "Method for marking defect and device therefor." This inventive defect marking device incorporates a flaw inspection mechanism equipped with multiple light-receiving components. These components are designed to identify reflected light originating from a metal strip's inspection plane under various optical conditions. The device also includes a signal processing section, which assesses the presence or absence of surface flaws based on the reflected light's unique combinations. The innovation culminates in a marking device that applies indicators related to the detected flaws on the metal strip’s surface, significantly improving quality assurance processes in manufacturing.

Career Highlights

Suyama's professional journey is marked by his role at NKK Corporation, where he further develops his inventions and contributes to the company's technological advancement. His innovative spirit is reflected in the successful implementation of his patents, which address critical issues in quality control within the metal industry.

Collaborations

Throughout his career, Suyama has collaborated with proficient colleagues, including Mitsuaki Uesugi and Shoji Yoshikawa. These collaborations have fostered a productive environment that nurtures innovation and the sharing of ideas, ultimately leading to more advanced solutions in defect marking and inspection technologies.

Conclusion

In summary, Tsuneo Suyama stands out as a pivotal figure in the landscape of invention, particularly in the realm of defect marking systems. His patents not only demonstrate his creativity and expertise but also showcase his commitment to enhancing industrial inspection processes. With continued efforts and innovative thinking, Suyama's contributions will likely influence the industry for years to come.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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