The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Sep. 17, 2001
Mitsuaki Uesugi, Yokosuka, JP;
Shoji Yoshikawa, Hachioji, JP;
Masaichi Inomata, Yokohama, JP;
Tsutomu Kawamura, Tokyo, JP;
Takahiko Oshige, Kawasaki, JP;
Hiroyuki Sugiura, Yokohama, JP;
Akira Kazama, Yokohama, JP;
Tsuneo Suyama, Fukuyama, JP;
Yasuo Kushida, Fukuyama, JP;
Shuichi Harada, Fukuyama, JP;
Hajime Tanaka, Fukuyama, JP;
Osamu Uehara, Fukuyama, JP;
Shuji Kaneto, Hiroshima, JP;
Masahiro Iwabuchi, Fukuyama, JP;
Kozo Harada, Fukuyama, JP;
Shinichi Tomonaga, Fukuyama, JP;
Shigemi Fukuda, Fukuyama, JP;
Mitsuaki Uesugi, Yokosuka, JP;
Shoji Yoshikawa, Hachioji, JP;
Masaichi Inomata, Yokohama, JP;
Tsutomu Kawamura, Tokyo, JP;
Takahiko Oshige, Kawasaki, JP;
Hiroyuki Sugiura, Yokohama, JP;
Akira Kazama, Yokohama, JP;
Tsuneo Suyama, Fukuyama, JP;
Yasuo Kushida, Fukuyama, JP;
Shuichi Harada, Fukuyama, JP;
Hajime Tanaka, Fukuyama, JP;
Osamu Uehara, Fukuyama, JP;
Shuji Kaneto, Hiroshima, JP;
Masahiro Iwabuchi, Fukuyama, JP;
Kozo Harada, Fukuyama, JP;
Shinichi Tomonaga, Fukuyama, JP;
Shigemi Fukuda, Fukuyama, JP;
NKK Corporation, Tokyo, JP;
Abstract
The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.