Fukuyama, Japan

Shinichi Tomonaga


Average Co-Inventor Count = 15.1

ph-index = 3

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2000-2009

where 'Filed Patents' based on already Granted Patents

5 patents (USPTO):

Title: The Innovations of Shinichi Tomonaga

Introduction

Shinichi Tomonaga is a notable inventor based in Fukuyama, Japan. He has made significant contributions to the field of defect marking technology, holding a total of 5 patents. His work is characterized by innovative methods that enhance the inspection processes in manufacturing.

Latest Patents

One of his latest patents is a method for marking defects and the device associated with it. This defect marking device includes a flaw inspection component that features multiple light-receiving parts. These parts identify reflected lights from the inspection plane of a metal strip under various optical conditions. The device also contains a signal processing section that determines the presence or absence of surface flaws based on the combination of reflected light components. Additionally, it includes a marking device that applies markings to indicate information related to the flaws on the surface of the metal strip.

Career Highlights

Shinichi Tomonaga is currently employed at NKK Corporation, where he continues to develop innovative solutions in his field. His expertise in defect marking technology has positioned him as a key figure in advancing manufacturing processes.

Collaborations

Throughout his career, Tomonaga has collaborated with notable colleagues such as Mitsuaki Uesugi and Shoji Yoshikawa. These collaborations have further enriched his work and contributed to the development of effective technologies in defect inspection.

Conclusion

Shinichi Tomonaga's contributions to defect marking technology exemplify the impact of innovation in manufacturing. His patents and collaborative efforts continue to influence the industry positively.

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