Fukuyama, Japan

Yasuo Kushida

USPTO Granted Patents = 3 

Average Co-Inventor Count = 17.0

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2007-2009

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3 patents (USPTO):Explore Patents

Title: Yasuo Kushida: Innovator in Flaw Detection Technology

Introduction

Yasuo Kushida, a skilled inventor based in Fukuyama, Japan, is known for his contributions to the field of defect detection technology. With a total of three patents to his name, Kushida has demonstrated a keen ability to innovate solutions that enhance the capabilities of flaw inspection devices in various applications.

Latest Patents

His latest patent focuses on a "Method for marking defect and device therefor." This patent describes a sophisticated defect marking device, which incorporates a flaw inspection system equipped with multiple light-receiving components. These components identify reflected lights originating from the inspection plane of a metal strip under varying optical conditions. A dedicated signal processing section determines the presence or absence of surface flaws by analyzing the combination of reflected light components captured under these differing conditions. The device includes a marking unit that applies visible indicators to signify information related to flaws on the metal strip’s surface, thereby improving defect management and quality assurance processes.

Career Highlights

Yasuo Kushida's work at NKK Corporation has positioned him as a key player in advancing flaw detection technologies. His innovative approaches contribute not only to the efficiency of defect identification but also to overall product quality within the manufacturing sector. His efforts have been instrumental in setting new standards for industry practices regarding flaw detection.

Collaborations

Kushida collaborates with esteemed colleagues Mitsuaki Uesugi and Shoji Yoshikawa, combining their talents and expertise to push the boundaries of technological advancements. Their teamwork exemplifies the collaborative spirit required for significant innovations in the field of flaw detection.

Conclusion

Yasuo Kushida’s dedication to innovation and excellence in defect marking technology has resulted in valuable contributions that have potential applications in various industries. His patents not only reflect his ingenuity but also highlight the importance of continuous improvement in manufacturing processes. As a leading inventor, Kushida remains an influential figure in developing technologies that enhance product quality and efficiency.

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