The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 1992

Filed:

Mar. 20, 1990
Applicant:
Inventors:

Mitsuaki Uesugi, Kanagawa, JP;

Masaichi Inomata, Kanagawa, JP;

Assignee:

NKK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ;
Abstract

A three-dimensional curved surface shape measuring apparatus of the slit light rotating type. In accordance with a composite image .theta.(x', y') produced when a slit light is rotationally scanned with respect to a picture of an object to be measured and horizontal displacements x.sub.o and vertical displacement z.sub.o of an axis of rotation of the slit light with respect to an origin of a reference plane, a necessary computational processing is performed to determine a three-dimensional shape f(x, y) of the object surface which is free of distortion due to a perspective effect of a television camera.


Find Patent Forward Citations

Uesugi, Mitsuaki. (1992). Apparatus for measuring three-dimensional curved surface shapes (U.S. Patent No. 5104227). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5104227

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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