The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
Sep. 20, 2002
Tsutomu Kawamura, Tokyo, JP;
Mitsuaki Uesugi, Tokyo, JP;
Hirohiko Yanagita, Tsu, JP;
Noboru Kawasaki, Tsu, JP;
Hisashi Ito, Tsu, JP;
NKK Corporation, Tokyo, JP;
Abstract
A 3-D coordinate measurement is performed in such a way that an electrooptical distance-measuring device is used to measure a linear distance to a target point set on a surface of a measurement object, an angle measuring device is used to measure shifted angles of an optical axis of the electrooptical distance-measuring device, and a 3-D coordinate of the target point is measured according to a measured distance and a measured angle after the optical axis of the electrooptical distance-measuring device has been aligned to the target point. The present method includes a coordinate recognizing step for observing a plurality of targets, recognizing a plurality of target points, and calculating approximate 3-D coordinates of the target points; a macroscopic sighting step for approximate aligning the optical axis of the electrooptical distance-measuring device; and a microscopic sighting step for aligning the optical axis of the electrooptical distance-measuring device to the one of the target points in the predetermined viewfield range.