The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 1992

Filed:

Mar. 20, 1990
Applicant:
Inventors:

Mitsuaki Uesugi, Kanagawa, JP;

Masaichi Inomata, Kanagawa, JP;

Assignee:

NKK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ;
Abstract

A three-dimensional curved surface shape measuring apparatus of the slit light linear scanning type. In accordance with a composite image u(x', y') produced by image composing means when a slit light is scanned over a surface of an object to be measured, a measured value or computed value u.sub.o (x', y') of a composite image with respect to a reference plane, a light projecting angle .theta. to the reference plane and a reference plane-television camera distance a, a necessary computational processing is performed to determine a three-dimensional curved surface shape f(x, y) of the surface of the object which is free of any distortions due to a perspective effect of the television camera.


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