The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 1992

Filed:

Mar. 20, 1990
Applicant:
Inventors:

Mitsuaki Uesugi, Kanagawa, JP;

Masami Harayama, Kanagawa, JP;

Kazumi Ota, Toyama, JP;

Sotoaki Kawaguchi, Toyama, JP;

Hiroyuki Shibuya, Toyama, JP;

Assignee:

NKK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
738655 ; 356335 ; 364555 ; 382-1 ;
Abstract

A method of measuring an average particle size of granules. The method computes the average particle size on the basis of an n-order moment M.sub.n of an image of granules accumulated in a pile or of the image subjected to binarization or floating binarization. The method is capable of highly accurate and stable measurement on granules having many irregularities in the surface thereof and accumulated in a pile. The method can be used to continuously measure in real time the particle size of granules in a rotary tray of a rotary tray-type rolling granulating machine thereby adjusting the feed rate of a liquid binder to automatically control the particle size.


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