San Jose, CA, United States of America

Michael D Kirk


Average Co-Inventor Count = 3.7

ph-index = 16

Forward Citations = 762(Granted Patents)


Location History:

  • Swampscott, MA (US) (1995 - 1999)
  • Salem, MA (US) (1998 - 1999)
  • Los Altos, CA (US) (2010)
  • San Jose, CA (US) (1992 - 2017)
  • Los Altos Hills, CA (US) (2016 - 2020)

Company Filing History:


Years Active: 1992-2020

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28 patents (USPTO):Explore Patents

Title: Michael D Kirk: Innovator in Defect Material Classification

Introduction: Michael D Kirk, based in San Jose, CA, is an accomplished inventor with a total of 28 patents to his name. His work primarily focuses on advanced inspection systems that enhance material classification through innovative technologies. Michael's contribution to the field demonstrates a commitment to advancing the capabilities of defect detection.

Latest Patents: Among his most notable recent inventions is a unique inspection system designed for defect material classification. This system incorporates an illumination source that generates an illumination beam and features focusing elements to direct the beam onto a sample. It includes a detector, collection elements to guide radiation emanating from the sample to the detector, and a detection mode control device for imaging the sample in two or more detection modes. The detector generates multiple collection signals based on these modes, allowing for detailed analysis. The controller of the system determines defect scattering characteristics from the signals and classifies particles according to predetermined defect classifications, making it a significant advancement in material inspection technology.

Career Highlights: Michael D Kirk has held notable positions in leading technology companies, including Park Scientific Instruments and Kla-Tencor Corporation. His expertise in defect classification and material inspection has been instrumental in developing industry-leading technologies in these organizations.

Collaborations: Throughout his career, Michael has collaborated with talented professionals, including Sang-Il Park and Ian R Smith. These partnerships have contributed to the successful development of innovative systems that push the boundaries of defect detection and materials engineering.

Conclusion: With a strong portfolio of patents and a career marked by significant contributions to defect material classification technologies, Michael D Kirk continues to be a vital figure in the field of innovation. His ongoing efforts and advancements have the potential to shape the future of material inspection in various industries.

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