Average Co-Inventor Count = 3.75
ph-index = 16
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Kla Tencor Corporation (7 from 1,787 patents)
2. Park Scientific Instruments (7 from 12 patents)
3. Kla-tencor Technologies Corporation (4 from 641 patents)
4. Hyde Athletic Industries, Inc. (4 from 17 patents)
5. Thermomicroscopes Corporation (3 from 7 patents)
6. Other (2 from 832,680 patents)
7. Hyde Athletics Industries, Inc. (1 from 1 patent)
28 patents:
1. 10670537 - Systems and methods for defect material classification
2. 10234402 - Systems and methods for defect material classification
3. 10025894 - System and method to emulate finite element model based prediction of in-plane distortions due to semiconductor wafer chucking
4. 9646379 - Detection of selected defects in relatively noisy inspection data
5. 9430593 - System and method to emulate finite element model based prediction of in-plane distortions due to semiconductor wafer chucking
6. 9355440 - Detection of selected defects in relatively noisy inspection data
7. 8422010 - Methods and systems for determining a characteristic of a wafer
8. 8284394 - Methods and systems for determining a characteristic of a wafer
9. 7796805 - Defect detection
10. 7711521 - Methods and systems for detection of selected defects particularly in relatively noisy inspection data
11. 7373277 - Methods and systems for detection of selected defects particularly in relatively noisy inspection data
12. 6310342 - Optical microscope stage for scanning probe microscope
13. 6130427 - Scanning probe microscope with multimode head
14. 6057546 - Kinematically mounted probe holder for scanning probe microscope
15. 5974695 - Combination midsole stabilizer and enhancer