Michael Cook

Title: Michael Cook: Innovator in Semiconductor Technology

Introduction

Michael Cook is a notable inventor based in Windsor, GB. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on improving defect detection and alignment processes in lithography.

Latest Patents

One of Michael's latest patents is titled "Print Check Repeater Defect Detection." This patent provides systems and methods for detecting defects on a reticle. The system includes computer subsystems configured to perform repeater defect detection steps during the inspection process on a wafer. This involves identifying defects in test images through double detection and stacked defect detection, leading to the identification of final repeater defect candidates.

Another significant patent is "System and Method for Aligning Semiconductor Device Reference Images and Test Images." This method involves receiving and aligning multiple reference and test images of a wafer through both coarse and fine alignment processes. The fine alignment process includes measuring and correcting individual offsets between the reference and test images.

Career Highlights

Michael Cook has worked with prominent companies in the semiconductor industry, including KLA-Tencor Corporation and KLA Corporation. His experience in these organizations has allowed him to develop innovative solutions that enhance the efficiency and accuracy of semiconductor manufacturing processes.

Collaborations

Throughout his career, Michael has collaborated with talented individuals such as Hong Chen and Kenong Wu. These partnerships have contributed to the advancement of technology in the semiconductor field.

Conclusion

Michael Cook is a distinguished inventor whose work in semiconductor technology has led to valuable patents that improve defect detection and image alignment. His contributions continue to influence the industry positively.