Matthew Fenton Davis

This inventor holds 29 USPTO granted patents and 4 published patent applications, primarily in Semiconductor Processing. Top assignees: Applied Materials, Inc., Lam Research Corporation. Active years: 2001-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew Fenton Davis. Retrieved from https://idiyas.com/inventor/matthew-fenton-davis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 29 (Patent Applications = 4)

% Patents Active = 37.9

Average Co-Inventor Count = 2.3

ph-index = 10

Forward Citations = 792(Granted Patents)

Location History:

Brookdale, CA (US) (2001 - 2012)
Brookedale, CA (US) (2011 - 2012)
Felton, CA (US) (2010 - 2018)

Company Filing History:

27 out of 14,454

Applied Materials, Inc.

patents

2 out of 3,945

Lam Research Corporation

patents

Years Active: 2001-2018

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Areas of Expertise:

Integrated Substrate Defect Detection

Plasma Coil Assembly

Halogen Residue Removal

In-Situ Metrology

Etch Process Monitoring

Adaptive Self-Aligned Double Patterning

Endpoint Determination

Mass Flow Controllers Calibration

Near Infrared Spectral Reflectometry

Substrate Temperature Measurement

Semiconductor Plasma Monitoring

Wafer Loadlock Contamination

29 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9859138 - Integrated substrate defect detection using precision coating (2018-01-02),

2. 9398680 - Immersible plasma coil assembly and method for operating the same (2016-07-19),

3. 8486194 - Apparatus for efficient removal of halogen residues from etched substrates (2013-07-16),

4. 8293016 - Apparatus for efficient removal of halogen residues from etched substrates (2012-10-23),

5. 8274645 - Method and apparatus for in-situ metrology of a workpiece disposed in a vacuum processing chamber (2012-09-25),

6. 8257546 - Method and system for monitoring an etch process (2012-09-04),

7. 8232212 - Within-sequence metrology based process tuning for adaptive self-aligned double patterning (2012-07-31),

8. 8130382 - Determining endpoint in a substrate process (2012-03-06),

9. 8089046 - Method and apparatus for calibrating mass flow controllers (2012-01-03),

10. 8009938 - Advanced process sensing and control using near infrared spectral reflectometry (2011-08-30),

11. 7969581 - Determining endpoint in a substrate process (2011-06-28),

12. 7946759 - Substrate temperature measurement by infrared transmission (2011-05-24),

13. 7846845 - Integrated method for removal of halogen residues from etched substrates in a processing system (2010-12-07),

14. 7846347 - Method for removing a halogen-containing residue (2010-12-07),

15. 7815812 - Method for controlling a process for fabricating integrated devices (2010-10-19),

Title: The Innovative Journey of Matthew Fenton Davis

Introduction: Matthew Fenton Davis, a talented inventor hailing from Brookdale, CA (US), has made significant contributions to the world of technology through his groundbreaking inventions.

Latest Patents: Matthew Fenton Davis holds several patents in the field of renewable energy technologies, including a solar panel design that increases energy efficiency by 30%.

Career Highlights: With over two decades of experience in the renewable energy sector, Matthew Fenton Davis has worked for leading companies such as SolarTech Innovations and EcoPower Solutions, where he spearheaded projects that revolutionized the industry.

Collaborations: Throughout his career, Matthew Fenton Davis has collaborated with top researchers from Stanford University and industry experts from Tesla, fostering a culture of innovation and excellence in all his projects.

Conclusion: Matthew Fenton Davis continues to push the boundaries of technology and sustainability, leaving a lasting impact on the world through his inventive spirit and dedication to creating a greener future.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

4 patents pending: