Mark P Helsel

This inventor holds 25 USPTO granted patents, primarily in MEMS Scanning Technology. Top assignees: Microvision, Inc., Alliedsignal Inc.. Active years: 1997-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mark P Helsel. Retrieved from https://idiyas.com/inventor/mark-p-helsel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 25

% Patents Active = 72.0

Average Co-Inventor Count = 3.2

ph-index = 14

Forward Citations = 733(Granted Patents)

Company Filing History:

Years Active: 1997-2018

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Areas of Expertise:

MEMS Scanners

Scanning Laser Devices

Resonant Beam Scanner

Frequency Tunable Scanner

Electromagnetic Scanner

Diffraction Grating Display

Fatigue Resistant Apparatus

Raster Pinch Compensation

Active Tuning

Miniature Gyroscope

Auxiliary Arms

25 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9946062 - Microelectromechanical systems (MEMS) scanners for scanning laser devices (2018-04-17),

2. 9759909 - Scanning platforms for scanning laser devices (2017-09-12),

3. 8579443 - Scanned beam display having a redirected exit cone using a diffraction grating (2013-11-12),

4. 8218218 - Fatigue resistant MEMS apparatus and system (2012-07-10),

5. 8218014 - Electromagnetic scanner having variable coil width (2012-07-10),

6. RE41375 - Resonant beam scanner with raster pinch compensation (2010-06-14),

7. 7516896 - Frequency tunable resonant scanner with auxiliary arms (2009-04-14),

8. 7485485 - Method and apparatus for making a MEMS scanner (2009-02-03),

9. 7473888 - Display with compensated light source drive (2009-01-06),

10. 7310174 - Method and apparatus for scanning regions (2007-12-18),

11. 7157679 - Scanned beam display having compensation for pattern dependant heating of a light source (2007-01-02),

12. 7002716 - Method and apparatus for blending regions scanned by a beam scanner (2006-02-21),

13. 6924476 - Resonant beam scanner with raster pinch compensation (2005-08-02),

14. 6882462 - Resonant scanner with asymmetric mass distribution (2005-04-19),

15. 6687034 - Active tuning of a torsional resonant structure (2004-02-03),

Title: Innovator Spotlight: Mark P Helsel

Introduction:

Mark P Helsel, a prolific inventor based in Seattle, WA, has made significant contributions to the field of microelectromechanical systems (MEMS) scanners for scanning laser devices. With an impressive portfolio of 25 patents, Helsel's innovative work has revolutionized scanning laser technology.

Latest Patents:

Helsel's latest patents focus on enhancing the performance of MEMS scanners in scanning laser devices. By increasing the resistance to distortion in the mirror surface, these scanners can achieve improved functionality in applications such as scanning laser projectors and laser depth scanners. The innovative design features an offset connection to the scan plate, effectively minimizing rotational forces and reducing distortion in the scanning surface.

Career Highlights:

Helsel has garnered a wealth of experience and expertise in the industry, with notable stints at esteemed companies such as Microvision, Inc. and AlliedSignal Inc. His groundbreaking work has positioned him as a leading figure in the development of scanning platforms for laser devices, particularly those utilizing MEMS structures for mirror motion.

Collaborations:

Throughout his career, Helsel has collaborated with industry peers such as David William Wine and Clarence T Tegreene. Together, they have pushed the boundaries of innovation in laser technology, paving the way for new advancements in scanning efficiency and compact design.

Conclusion:

In conclusion, Mark P Helsel's dedication to advancing MEMS scanners for scanning laser devices has left an indelible mark on the industry. His inventive spirit and commitment to excellence continue to drive progress in the field, shaping the future of laser scanning technology.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]