The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Jan. 30, 2004
David W. Wine, Seattle, WA (US);
Mark P. Helsel, Seattle, WA (US);
Clarence T. Tegreene, Redmond, WA (US);
David W. Wine, Seattle, WA (US);
Mark P. Helsel, Seattle, WA (US);
Clarence T. Tegreene, Redmond, WA (US);
Microvision, Inc., Bothell, WA (US);
Abstract
A beam scanner is operable to scan light in two or more axes, typically in a raster pattern that includes a fast scan axis and a slow scan axis. Plural beams of light are scanned, each beam of light producing a scanned region that at least partially overlaps at least one adjoining scanned region. Scanned regions may be aligned to adjoin and overlap along a dimension corresponding to the slow scan axis. The beam scanner may comprise a scanned beam display and/or a scanned beam image capture device. In a display, the power level of overlapping displayed pixels may be scaled to provide smooth transitions between adjoining regions to improve the image quality presented to a viewer. In an image capture device, one or more detectors is operable to collect light scattered from adjoining regions and a controller is operable to produce an image from the scanned regions.