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For the Inventor, By the Inventor

Portland, OR, United States of America

Mark L Guenther

USPTO Granted Patents = 13 

 

Average Co-Inventor Count = 1.8

ph-index = 4

Forward Citations = 56(Granted Patents)


Location History:

  • Novi, MI (US) (2012 - 2016)
  • Portland, OR (US) (2004 - 2023)

Company Filing History:

goldMedal11 out of 2,729 
 
Tektronix, Inc.
 patents
silverMedal2 out of 832,880 
Other
 patents

Years Active: 2004-2025

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13 patents (USPTO):Explore Patents
1. 12385949 - Semi-automated oscilloscope noise compensation based on power spectral density characterization (2025-08-12),
2. 11624781 - Noise-compensated jitter measurement instrument and methods (2023-04-11),
3. 9294237 - Method for performing joint jitter and amplitude noise analysis on a real time oscilloscope (2016-03-22),
4. 9243983 - Emissions test system and method (2016-01-26),
5. 8670947 - Computer system for automatically determining slew rate de-rating values (2014-03-11),
6. 8594169 - Method for decomposing and analyzing jitter using spectral analysis and time-domain probability density (2013-11-26),
7. 8272248 - Emissions test system and method (2012-09-25),
8. 8165184 - Apparatus and method for synthesizing and generating an SSC modulated signal (2012-04-24),
9. 7254168 - Method for decomposing timing jitter on arbitrary serial data sequences (2007-08-07),
10. 7006092 - Method and apparatus for representing complex vector data (2006-02-28),
11. 6853933 - Method of identifying spectral impulses for Rj Dj separation (2005-02-08),
12. 6832172 - Apparatus and method for spectrum analysis-based serial data jitter measurement (2004-12-14),
13. 6735554 - Method and apparatus for representing complex vector data (2004-05-11),

Title: Mark L Guenther: Innovator in Test and Measurement Technology

Introduction

Mark L Guenther is a prominent inventor based in Portland, OR (US), known for his significant contributions to the field of test and measurement technology. With a total of 13 patents to his name, Guenther has developed innovative solutions that enhance the performance and accuracy of measurement instruments.

Latest Patents

One of Guenther's latest patents is titled "Semi-automated oscilloscope noise compensation based on power spectral density characterization." This invention involves a method for dynamically determining an oscilloscope noise characteristic by retrieving a power spectral density (PSD) model of noise and generating a representation of any filtering applied to a waveform. The modified PSD is then used to determine a dynamic oscilloscope noise characteristic, improving the accuracy of measurements.

Another notable patent is the "Noise-compensated jitter measurement instrument and methods." This device includes an input for receiving a test waveform from a Device Under Test (DUT) and features a selector that extracts portions of the waveform matching predefined patterns. It also includes a noise compensator that removes jitter measurement components caused by random noise, resulting in a more accurate jitter measurement of the DUT.

Career Highlights

Throughout his career, Mark L Guenther has worked with several notable companies, including Tektronix, Inc. His experience in these organizations has allowed him to refine his skills and contribute to advancements in measurement technology.

Collaborations

Guenther has collaborated with talented individuals such as Kan Tan and Pavel R Zivny, further enhancing the innovative work produced in the field of test and measurement.

Conclusion

Mark L Guenther's contributions to the field of test and measurement technology through his patents and collaborations have made a significant impact. His innovative solutions continue to advance the accuracy and efficiency of measurement instruments.

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