The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
Nov. 24, 2014
Tektronix, Inc., Beaverton, OR (US);
Mark L. Guenther, Portland, OR (US);
Kan Tan, Portland, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A method for determining jitter and noise of an input signal. The method includes acquiring one or more uncorrelated waveform records by an acquisition unit of a test and measurement instrument, determining a correlated waveform from the acquired waveform(s), dividing the correlated waveform into unit intervals, dividing an uncorrelated waveform into unit intervals, measuring a timing displacement (t) between the correlated waveform and the uncorrelated waveform for each unit interval to form an apparent-jitter array ([t]), measuring a voltage displacement (V) between the correlated waveform and the uncorrelated waveform for reach unit interval to form an apparent-noise array ([V]), calculating a horizontal shift (t) between the correlated waveform and the uncorrelated waveform for each unit interval to form a compensated edge time array ([t]), and calculating a vertical shift (V) between the correlated waveform and the uncorrelated waveform for each unit interval to form a compensated amplitude voltage array ([V]).