For the Inventor, By the Inventor

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Beaverton, OR, United States of America

Tektronix, Inc.

USPTO Granted Patents = 2,758

% Expired Patents = 12.8

CIPO Patents = 2

EPO Patents = 247

Trademarks = 35

Forward Citations = 44,183

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1,796 inventors (with patents filed for the assignee):

Daniel G Knierim (81 out of 84 patents)

John J Pickerd (66 out of 70 patents)

Kenneth P Dobyns (57 out of 58 patents)

4. Kan Tan (52 out of 53 patents)

5. Thomas S Buzak (45 out of 52 patents)

6. Daniel G Baker (40 out of 43 patents)

7. Kevin M Ferguson (40 out of 53 patents)

8. Robert R Kreitzer (38 out of 38 patents)

9. Ira G Pollock (34 out of 34 patents)

10. J Steven Lyford (32 out of 32 patents)

11. Kevin J Ilcisin (32 out of 44 patents)

12. Donald R Titterington (30 out of 95 patents)

13. Bruce J Penney (30 out of 31 patents)

14. Steven K Sullivan (29 out of 32 patents)

15. Michael J Mende (28 out of 30 patents)

Core Competencies:

Anomaly Detection

Machine Learning

Oscilloscope

Signal Processing

Test Instrument

Calibration

Waveform Analysis

Optical Tuning

High-Speed Testing

Probe Technology

Frequency Range

Data Converter

2,758 patents: Sort by Forward Citations

1. 12699137 - Defect analysis of electric motors using reference frames (DQZ components) (2026-08-04),

2. 12693658 - Runtime data collection and monitoring in machine learning systems (2026-07-28),

3. 12693325 - System and method for determining probe skew (2026-07-28),

4. 12687563 - Separating noise to increase machine learning prediction accuracy in a test and measurement system (2026-07-21),

5. 12676683 - Methods and systems of phase aligning a replica carrier signal for use in demodulating a subcarrier signal (2026-07-07),

6. 12665044 - Technique to analyze and report accurate data, synchronizing multiple signals in a memory chip (2026-06-23),

7. 12663465 - Test and measurement instrument accessory with reconfigurable processing component (2026-06-23),

8. 12663463 - Split-path multiplexing accessory for a test and measurement instrument (2026-06-23),

9. 12656374 - Shunt for use in busbar-to-module connections (2026-06-16),

10. 12656373 - Automatic determination of spectrum and spectrogram attributes in a test and measurement instrument (2026-06-16),

11. 12644910 - Current monitor combining a shunt resistor with a Rogowski coil (2026-06-02),

12. 12607667 - System and method for detection of anomalies in test and measurement results of a device under test (DUT) (2026-04-21),

13. 12603805 - BPSK subcarrier demodulation using direct filters without down conversion (2026-04-14),

14. 12596145 - Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance (2026-04-07),

15. 12590996 - Systems, devices, and methods for measuring direct current/low frequency signal components (2026-03-31),

Company Overview

Tektronix, Inc., based in Beaverton, Oregon, specializes in test and measurement solutions that empower engineers and scientists to innovate and improve their designs. The company is renowned for its advanced oscilloscopes and signal processing instruments, which are integral in various industries including telecommunications, aerospace, and automotive. Tektronix focuses on core technologies such as anomaly detection, machine learning, and optical tuning, providing essential tools for calibration and waveform analysis to enhance product development and testing processes.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

2,758 Patents

#2 in Beaverton, OR

#2 in Oregon

#172 in US

#346 in the World

Beaverton, OR, United States of America

Tektronix, Inc.

Forward Citations = 44,183

1,796 inventors:

Daniel G Knierim (81 out of 84 patents)

John J Pickerd (66 out of 70 patents)

Kenneth P Dobyns (57 out of 58 patents)

4. Kan Tan (52 out of 53 patents)

5. Thomas S Buzak (45 out of 52 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Tektronix, Inc.. Retrieved from https://idiyas.com/company/tektronix

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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