John J Pickerd

This inventor holds 69 USPTO granted patents and 29 published patent applications and 18 EPO patents, primarily in Machine Learning (CPC class G01R). Top assignees: Tektronix, Inc., Sonix, Inc., Tektronic, Inc.. Active years: 1999-2026.

USPTO Granted Patents = 69 (Patent Applications = 29)

% Patents Active = 66.7

EPO Patents = 18 (Patent Applications = 13)

Average Co-Inventor Count = 1.7

ph-index = 12

Forward Citations = 355(Granted Patents)

Forward Citations (Not Self Cited) = 315(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Beaverton, OR (US) (2005 - 2007)
Hillsboro, OR (US) (1999 - 2024)

Company Filing History:

Years Active: 1999-2026

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Areas of Expertise:

Optical Tuning

Signal Processing

Defect Detection

Machine Learning

Digital Signal Processing

Cavity Filter Tuning

Waveform Synthesis

Noise Reduction

Time-Domain Analysis

S-Parameter Measurement

Data Acquisition

Harmonic Mixing

69 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12693658 - Runtime data collection and monitoring in machine learning systems (2026-07-28),

2. 12687563 - Separating noise to increase machine learning prediction accuracy in a test and measurement system (2026-07-21),

3. 12596145 - Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance (2026-04-07),

4. 12583122 - Automated cavity filter tuning using machine learning (2026-03-24),

5. 12573021 - Ultrasonic defect detection and classification system using machine learning (2026-03-10),

6. 12571841 - General digital signal processing waveform machine learning control application (2026-03-10),

7. 12505532 - Method and apparatus for automated defect detection (2025-12-23),

8. 12442852 - Tuning a device under test using parallel pipeline machine learning assistance (2025-10-14),

9. 12379414 - System and method for multi-level signal cyclic loop image representations for measurements and machine learning (2025-08-05),

10. 12328242 - Eye classes separator with overlay, and composite, and dynamic eye-trigger for humans and machine learning (2025-06-10),

11. 12265125 - System and method for separation and classification of signals using cyclic loop images (2025-04-01),

12. 12146914 - Bit error ratio estimation using machine learning (2024-11-19),

13. 12092692 - Cyclic loop image representation for waveform data (2024-09-17),

14. 12085590 - Swept parameter oscilloscope (2024-09-10),

15. 11940889 - Combined TDECQ measurement and transmitter tuning using machine learning (2024-03-26),

Title: John J. Pickerd: Innovator in Test and Measurement Technologies

Introduction

John J. Pickerd, based in Hillsboro, Oregon, is a notable innovator in the field of test and measurement systems. With an impressive portfolio of 58 patents, he has made significant contributions to the technological landscape, particularly in the area of machine learning applications for signal analysis.

Latest Patents

Among his latest inventions are two groundbreaking patents. The first is focused on "Bit error ratio estimation using machine learning." This innovative system integrates a test and measurement device with a machine learning framework to analyze waveforms from a device under test (DUT). It transforms these waveforms into a composite image, allowing for accurate determination of the bit error ratio (BER).

The second patent, titled "Cyclic loop image representation for waveform data," describes a test and measurement instrument that processes non-return-to-zero (NRZ) waveform signals. This innovation includes a ramp generator and gating mechanisms to produce cyclic loop images from the waveforms, enhancing the display and analysis capabilities.

Career Highlights

John J. Pickerd has established himself as a leading engineer at Tektronix, Inc., a renowned company recognized for its excellence in test and measurement equipment. His work has continuously pushed the boundaries of what is possible in electronic testing, and his contributions are widely valued in the engineering community.

Collaborations

Throughout his career, John has worked alongside talented colleagues, including Kan Tan and Pirooz Hojabri. Their collaborative efforts have led to groundbreaking advancements and innovations in their respective fields, further enhancing the capabilities of Tektronix, Inc.

Conclusion

In conclusion, John J. Pickerd stands out as a significant figure in the realm of test and measurement innovations. With a robust portfolio of patents and a dedication to advancing technology, he continues to inspire future generations of engineers and inventors.