The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2024

Filed:

Jun. 11, 2021
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventor:

John J. Pickerd, Hillsboro, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G01R 13/02 (2006.01); G01R 31/317 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G01R 31/31908 (2013.01); G01R 13/0272 (2013.01); G01R 31/31708 (2013.01); G01R 31/31905 (2013.01); G06N 20/00 (2019.01);
Abstract

A test and measurement instrument includes an input to receive a non-return-to-zero (NRZ) waveform signal from a device under test, a ramp generator to use the NRZ waveform signal to generate a ramp sweep signal, a gate to gate the ramp sweep signal and the NRZ waveform signal to produce gated X-axis and Y-axis data, and a display to display the gated X-axis and Y-axis data as a cyclic loop image. A method of generating a cyclic loop image includes receiving an input waveform, using the input waveform to generate a ramp sweep signal, gating the ramp sweep signal and the input waveform to produce gated X-axis and Y-axis data, and displaying the gated X-axis and Y-axis data as a cyclic loop image.


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