The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Jul. 10, 2023
Tektronix, Inc., Beaverton, OR (US);
Vivek Shivaram, Bengaluru, IN;
Niranjan R Hegde, Siddapur, IN;
Shubha B, Bengaluru, IN;
Krishna N H Sri, Bengaluru, IN;
Yogesh M. Pai, Bengaluru, IN;
Venkatraj Melinamane, Bengaluru, IN;
Tektronix, Inc., Beaverton, OR (US);
Abstract
A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.
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