The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2005
Filed:
Feb. 26, 2003
Applicants:
Kan Tan, Beaverton, OR (US);
Mark L. Guenther, Portland, OR (US);
Inventors:
Kan Tan, Beaverton, OR (US);
Mark L. Guenther, Portland, OR (US);
Assignee:
Tektronix, Inc., Beaverton, OR (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R023/16 ; G01R013/00 ; H04B017/00 ;
U.S. Cl.
CPC ...
Abstract
A method for identifying spectral impulses applies a window filter to an acquired waveform to produce a filtered waveform, and performs an FFT function on the filtered waveform to produce a spectrum of bins. An estimating window is located on the spectrum and centered on a target bin. Bins adjacent to the target bin are excluded and the remaining bins are used to form a noise estimate. The estimate is compared to the target bin and if the result exceeds a threshold value, a spectral impulse is identified.