The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2014

Filed:

Apr. 30, 2010
Applicants:

G. R. N. Prasanth, Bangalore, IN;

Pechluck Pongched, Portland, OR (US);

Raghavendran N., Bangalore, IN;

Mark L. Guenther, Portland, OR (US);

Krishna N. H. Sri, Bangalore, IN;

Manisha D. Ajgaonkar, Bangalore, IN;

Anuradha V., Bangalore, IN;

Inventors:

G. R. N. Prasanth, Bangalore, IN;

Pechluck Pongched, Portland, OR (US);

Raghavendran N., Bangalore, IN;

Mark L. Guenther, Portland, OR (US);

Krishna N. H. Sri, Bangalore, IN;

Manisha D. Ajgaonkar, Bangalore, IN;

Anuradha V., Bangalore, IN;

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the invention provide a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include, for example, a test and measurement instrument such as an oscilloscope. In another embodiment of the present invention, slew rate de-rated values may be automatically determined through the use of configurable lookup tables.


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