Bengaluru, India

Anuradha V

This inventor holds 1 USPTO granted patent. Top assignee: Tektronix, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anuradha V. Retrieved from https://idiyas.com/inventor/anuradha-v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2014

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Anuradha V: Innovator in Computer Systems

Introduction

Anuradha V is a talented inventor based in Bengaluru, India. She has made significant contributions to the field of computer systems, particularly in the area of measuring and representing limit values in relation to system performance.

Latest Patents

Anuradha holds a patent for a "Computer system for automatically determining slew rate de-rating values." This invention provides a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include a test and measurement instrument, such as an oscilloscope. Additionally, the invention allows for the automatic determination of slew rate de-rated values through the use of configurable lookup tables. She has 1 patent to her name.

Career Highlights

Anuradha is currently employed at Tektronix, Inc., where she continues to innovate and develop advanced technologies. Her work has been instrumental in enhancing the capabilities of measurement systems.

Collaborations

Anuradha has collaborated with notable coworkers, including Raghavendran N and G R N Prasanth, contributing to various projects and advancements in her field.

Conclusion

Anuradha V is a remarkable inventor whose work in computer systems showcases her innovative spirit and dedication to advancing technology. Her contributions are paving the way for future developments in measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…