Bengaluru, India

Raghavendran N

This inventor holds 1 USPTO granted patent. Top assignee: Tektronix, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Raghavendran N. Retrieved from https://idiyas.com/inventor/raghavendran-n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Raghavendran N: Innovator in Computer Systems

Introduction

Raghavendran N is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of computer systems, particularly in the area of measuring and representing limit values in relation to system performance.

Latest Patents

Raghavendran holds a patent for a "Computer system for automatically determining slew rate de-rating values." This invention provides a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include a test and measurement instrument, such as an oscilloscope. Additionally, the invention allows for the automatic determination of slew rate de-rated values through the use of configurable lookup tables.

Career Highlights

Raghavendran is currently employed at Tektronix, Inc., where he continues to innovate and develop advanced technologies. His work focuses on enhancing the efficiency and accuracy of measurement systems.

Collaborations

Some of Raghavendran's coworkers include G R N Prasanth and Pechluck Pongched, who contribute to the collaborative environment at Tektronix, Inc.

Conclusion

Raghavendran N is a prominent figure in the field of computer systems, with a patent that showcases his innovative approach to technology. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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