Portland, OR, United States of America

Pechluck Pongched

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Tektronix, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pechluck Pongched. Retrieved from https://idiyas.com/inventor/pechluck-pongched

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Pechluck Pongched: Innovator in Computer Systems

Introduction

Pechluck Pongched is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of computer systems, particularly in the area of measuring and representing limit values in relation to system performance.

Latest Patents

Pechluck holds a patent for a "Computer system for automatically determining slew rate de-rating values." This invention provides a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include a test and measurement instrument, such as an oscilloscope. Additionally, the invention allows for the automatic determination of slew rate de-rated values through the use of configurable lookup tables.

Career Highlights

Pechluck Pongched is currently employed at Tektronix, Inc., where he continues to innovate and develop advanced technologies. His work focuses on enhancing the accuracy and efficiency of measurement systems.

Collaborations

Pechluck has collaborated with talented individuals such as G R N Prasanth and Raghavendran N. These partnerships have contributed to the advancement of his projects and the successful implementation of his inventions.

Conclusion

Pechluck Pongched is a distinguished inventor whose work in computer systems has led to valuable advancements in technology. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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