The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Apr. 06, 2011
Pavel Zivny, Portland, OR (US);
Mark L. Guenther, Portland, OR (US);
Pavel Zivny, Portland, OR (US);
Mark L. Guenther, Portland, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A method for analyzing jitter using a test and measurement instrument includes obtaining a collection of time interval error (TIE) values corresponding to composite jitter of a waveform, optionally decomposing the composite jitter into jitter components that are correlated to the data pattern and components that are uncorrelated to the data pattern, and using a spectral approach to decompose the jitter components into jitter components that are recognizable as deterministic and jitter components that are unrecognizable as deterministic. Thereafter, the jitter components analyzed in the frequency domain are converted back to the time domain, and subtracted from the composite jitter, thereby isolating uncorrelated residual jitter. The uncorrelated residual jitter is decomposed into bounded uncorrelated jitter and random jitter, for example, by integrating a probability density (PDF) function of the residual jitter and analyzing the resulting cumulative distribution function (CDF) curve in Q-space.