This inventor holds 3 USPTO granted patents and 1 published patent application and 4 EPO patents. Top assignee: Bruker Axs Gmbh. Active years: 2006-2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2006-2024
Title: Lutz Brügemann: X-Ray Measurement Innovations
Introduction
Lutz Brügemann is an inventor based in Durmersheim, Germany. His patent work focuses on X-ray measurement arrangements and detector designs. Brügemann is associated with 3 patents.
Latest Patents
Brügemann’s recent inventions address the accuracy and continuity of X-ray measurements.
“Measurement Arrangement for X-Ray Radiation for Gap-Free 1D Measurement” describes an X-ray detector made up of multiple detector modules. The modules overlap along the measurement direction so that an active, X-ray-sensitive zone on one module bridges a dead zone on another. This arrangement is designed to provide gap-free, one-dimensional measurement information, including X-ray diffraction data.
“Measuring Arrangement for X-Ray Radiation Having Reduced Parallax Effects” describes a detector with sensor elements arranged in a common plane. The elements are spaced so that their centroids are at equal distances from the sample position. The design can use flat detector modules, including semiconductor modules, and is intended to reduce susceptibility to measurement errors caused by parallax effects.
Career Highlights
Brügemann’s work is associated with Bruker AXS GmbH and Bruker AXS SE. His patent contributions reflect a focus on detector geometry and measurement reliability in X-ray applications.
Collaborations
Brügemann’s listed coworkers include Jürgen Fink and Christian Maurer. Their shared professional context is connected with Bruker’s X-ray measurement and instrumentation work.
Conclusion
Lutz Brügemann’s inventions address practical challenges in X-ray detection by supporting gap-free measurements and reducing parallax-related errors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile