The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jun. 17, 2020
Bruker Axs Gmbh, Karlsruhe, DE;
Jürgen Fink, Elchesheim-Illingen, DE;
Christian Maurer, Karlsruhe, DE;
Lutz Brügemann, Durmersheim, DE;
Cristian Venanzi, Karlsruhe, DE;
Abstract
A measuring arrangement () for x-ray radiation, comprising—a sample position (), which can be illuminated by xray radiation () and—an x-ray detector () for detecting x-ray radiation emitted from the sample position (), comprising at least one detector module (-), wherein the detector module (-) has a plurality of sensor elements (-) arranged successively in a measuring direction (MR), each sensor element having a centroid (), wherein the sensor elements (-) are arranged in a common sensor plane () of the detector module (-), is characterized in that at least a majority of the sensor elements (-) of the detector module (-), preferably all the sensor elements (-) of the detector module (-), are designed as uniformly spaced sensor elements (-), wherein the centroids () of the sensor elements (-) have an equal distance Rfrom the sample position (). The measuring arrangement according to the invention can be implemented having flat detector modules, in particular semiconductor detector modules, and is less susceptible to measurement errors.