Elchesheim-Illingen, Germany

Jürgen Fink

This inventor holds 2 USPTO granted patents and 1 published patent application and 3 EPO patents. Active years: 2023-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jürgen Fink. Retrieved from https://idiyas.com/inventor/jürgen-fink-46dwanep

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Years Active: 2023-2024

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2 patents (USPTO):Explore Patents

Title: Jürgen Fink: Innovator in X-ray Measurement Technology

Introduction

Jürgen Fink is a notable inventor based in Elchesheim-Illingen, Germany. He has made significant contributions to the field of X-ray measurement technology, holding 2 patents that enhance the accuracy and efficiency of X-ray detection systems. His work is characterized by innovative solutions that address common challenges in measurement arrangements.

Latest Patents

Fink's latest patents include a "Measurement arrangement for X-ray radiation for gap-free 1D measurement." This invention proposes an X-ray detector with multiple detector modules, each featuring both dead zones without X-ray sensitivity and active zones with spatially resolved X-ray sensitivity. The design allows for overlapping detector modules, ensuring that the dead zones of one module are effectively bridged by the active zones of another, resulting in seamless one-dimensional measurement information, particularly for X-ray diffraction.

Another significant patent is the "Measuring arrangement for X-ray radiation having reduced parallax effects." This arrangement includes a sample position illuminated by X-ray radiation and a detector module with sensor elements arranged in a common sensor plane. The design minimizes measurement errors by ensuring that the sensor elements are uniformly spaced, enhancing the reliability of the measurements.

Career Highlights

Throughout his career, Jürgen Fink has worked with prominent companies in the field, including Bruker AXS SE and Bruker AXS GmbH. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in X-ray technology.

Collaborations

Fink has collaborated with notable colleagues such as Christian Maurer and Lutz Brügemann. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies in the field of X-ray measurement.

Conclusion

Jürgen Fink's contributions to X-ray measurement technology through his patents and collaborations highlight his role as an influential inventor. His innovative solutions continue to impact the field, paving the way for more accurate and efficient measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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