The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Feb. 18, 2020
Bruker Axs Gmbh, Karlsruhe, DE;
Jürgen Fink, Elchesheim-Illingen, DE;
Christian Maurer, Karlsruhe, DE;
Lutz Brügemann, Durmersheim, DE;
Cristian Venanzi, Karlsruhe, DE;
Abstract
In summary, the present invention proposes embodying an X-ray detector () with a plurality of detector modules (-), each comprising dead zones () without X-ray sensitivity and active zones (-) with X-ray sensitivity that is spatially resolved in a measurement direction (MR), wherein the detector modules (-) are embodied successively and in an overlapping fashion along the measurement direction (MR), such that in overlap regions (-) the dead zone () of one detector module (-) is bridged by an active zone (-) of another detector module (-). The overlapping detector modules (-) are arranged next to one another in the transverse direction (QR) in the overlap regions (-), wherein the transverse direction (QR) runs transversely with respect to the local measurement direction (MR) and transversely with respect to a local connection direction (VR) with respect to a sample position (). The X-ray detector () makes it possible, in a simple manner, to obtain gapless, one-dimensional measurement information, in particular X-ray diffraction information, from a measurement sample () at the sample position ().