Bruker Axs Gmbh

Bruker Axs Se

Lutz Brügemann

Joachim Lange

Rolf Schipper

Christian Maurer

Jürgen Fink

Ekkehard Gerndt

Assunta Vigliante

Cristian Venanzi

Kurt Helming

Carsten Michaelsen

In summary, the present invention proposes embodying an X-ray detector () with a plurality of detector modules (-), each comprising dead zones () without X-ray sensitivity and active zones (-) with X-ray sensitivity that is spatially resolved in a measurement direction (MR), wherein the detector modules (-) are embodied successively and in an overlapping fashion along the measurement direction (MR), such that in overlap regions (-) the dead zone () of one detector module (-) is bridged by an active zone (-) of another detector module (-). The overlapping detector modules (-) are arranged next to one another in the transverse direction (QR) in the overlap regions (-), wherein the transverse direction (QR) runs transversely with respect to the local measurement direction (MR) and transversely with respect to a local connection direction (VR) with respect to a sample position (). The X-ray detector () makes it possible, in a simple manner, to obtain gapless, one-dimensional measurement information, in particular X-ray diffraction information, from a measurement sample () at the sample position ().

Measurement arrangement for X-ray radiation for gap-free 1D measurement

A measuring arrangement () for x-ray radiation, comprising&#x2014;a sample position (), which can be illuminated by xray radiation () and&#x2014;an x-ray detector () for detecting x-ray radiation emitted from the sample position (), comprising at least one detector module (-), wherein the detector module (-) has a plurality of sensor elements (-) arranged successively in a measuring direction (MR), each sensor element having a centroid (), wherein the sensor elements (-) are arranged in a common sensor plane () of the detector module (-), is characterized in that at least a majority of the sensor elements (-) of the detector module (-), preferably all the sensor elements (-) of the detector module (-), are designed as uniformly spaced sensor elements (-), wherein the centroids () of the sensor elements (-) have an equal distance Rfrom the sample position (). The measuring arrangement according to the invention can be implemented having flat detector modules, in particular semiconductor detector modules, and is less susceptible to measurement errors.

Measuring arrangement for x-ray radiation having reduced parallax effects

An X-ray optical system comprising an X-ray source (), from which X-ray radiation () is guided to a sample () under investigation, and an X-ray detector () for receiving radiation () diffracted or scattered from the sample (), wherein a beam-guiding X-ray optical element (), such as e.g. a collimator, a mono- or polycapillary, an X-ray mirror or a monochromator, is disposed between the source () and the sample () and/or between the sample () and the detector (), is characterized in that a wobble means is provided for moving the X-ray optical element () in an oscillating fashion during the measurement. The inventive X-ray optical system obtains averaged X-ray analysis information from objects under investigation having large mass which consist of macrocrystalline material without destroying or accelerating the object under investigation.

X-ray optical system with wobble device

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Durmersheim, Germany

Lutz Brügemann