The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2006
Filed:
Mar. 29, 2004
Kurt Helming, Dresden, DE;
Lutz Brügemann, Durmersheim, DE;
Kurt Helming, Dresden, DE;
Lutz Brügemann, Durmersheim, DE;
Bruker Axs GmbH, Karlsruhe, DE;
Abstract
An X-ray optical system comprising an X-ray source (), from which X-ray radiation () is guided to a sample () under investigation, and an X-ray detector () for receiving radiation () diffracted or scattered from the sample (), wherein a beam-guiding X-ray optical element (), such as e.g. a collimator, a mono- or polycapillary, an X-ray mirror or a monochromator, is disposed between the source () and the sample () and/or between the sample () and the detector (), is characterized in that a wobble means is provided for moving the X-ray optical element () in an oscillating fashion during the measurement. The inventive X-ray optical system obtains averaged X-ray analysis information from objects under investigation having large mass which consist of macrocrystalline material without destroying or accelerating the object under investigation.