logo

For the Inventor, By the Inventor

Goleta, CA, United States of America

Lin Huang

This inventor holds 10 USPTO granted patents and 1 EPO patent. Top assignees: Bruker Nano Gmbh, Veeco Instruments Inc.. Active years: 2005-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lin Huang. Retrieved from https://idiyas.com/inventor/lin-huang-o4w98nzy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 10

% Patents Active = 60.0

 

Average Co-Inventor Count = 2.9

ph-index = 5

Forward Citations = 79(Granted Patents)


Location History:

  • Goleta, CA (US) (2005 - 2015)
  • Santa Barbara, CA (US) (2015 - 2018)

Company Filing History:

goldMedal5 out of 169 
 
Bruker Nano Gmbh
 patents
silverMedal5 out of 312 
 
Veeco Instruments Inc.
 patents

Years Active: 2005-2018

Loading Chart...
Loading Chart...
10 patents (USPTO):Explore Patents
1. 9869694 - Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode (2018-01-16),
2. 9213047 - Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode (2015-12-15),
3. 9116167 - Method and apparatus of tuning a scanning probe microscope (2015-08-25),
4. 8997259 - Method and apparatus of tuning a scanning probe microscope (2015-03-31),
5. 8205487 - Probe microscope setup method (2012-06-26),
6. 7757544 - Method and apparatus for measuring electrical properties in torsional resonance mode (2010-07-20),
7. 7607342 - Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument (2009-10-27),
8. 7513142 - Tracking qualification and self-optimizing probe microscope and method (2009-04-07),
9. 7155964 - Method and apparatus for measuring electrical properties in torsional resonance mode (2007-01-02),
10. 6945099 - Torsional resonance mode probe-based instrument and method (2005-09-20),

Title: Lin Huang - Innovator in Electrical Property Measurement

Introduction

Lin Huang is a prominent inventor based in Goleta, CA (US), known for his significant contributions to the field of electrical property measurement. He holds a total of 10 patents, showcasing his innovative approach and expertise in utilizing atomic force microscopy (AFM) technology.

Latest Patents

One of Lin Huang's latest patents is a method and apparatus for electrical property measurement using an AFM operating in peak force tapping mode. This invention allows for the collection of topography, mechanical property data, and electrical property data with an AFM in either a single pass or a dual pass operation. The use of peak force tapping (PFT) mode enhances the sensitivity of electrical property measurement by allowing the use of a wide range of probes.

Career Highlights

Throughout his career, Lin Huang has worked with notable companies such as Veeco Instruments Inc. and Bruker Nano GmbH. His experience in these organizations has contributed to his development as a leading inventor in his field.

Collaborations

Lin Huang has collaborated with talented individuals, including Chanmin Su and Shuiqing Hu, further enriching his work and contributions to the industry.

Conclusion

Lin Huang's innovative work in electrical property measurement and his impressive portfolio of patents highlight his significant impact on the field. His contributions continue to advance the capabilities of atomic force microscopy technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…