The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Aug. 12, 2005
Applicants:
Alan F. Rice, Santa Barbara, CA (US);
Lin Huang, Goleta, CA (US);
Inventors:
Alan F. Rice, Santa Barbara, CA (US);
Lin Huang, Goleta, CA (US);
Assignee:
Veeco Instruments Inc., Plainview, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scanning probe microscope and method of operation for monitoring and assessing proper tracking between the tip and sample, as well as automating at least some aspects of AFM setup previously done manually. Preferably, local slopes corresponding to the acquired data are compared to determine a tracking metric that is self-normalizing.
Quick Actions:
Rice, Alan. (2009). Tracking qualification and self-optimizing probe microscope and method (U.S. Patent No. 7513142). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7513142
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