The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
Nov. 12, 2012
Applicant:
Bruker Nano, Inc., Santa Barbara, CA (US);
Inventors:
Chanmin Su, Ventura, CA (US);
Paul Silva, Goleta, CA (US);
Lin Huang, Goleta, CA (US);
Bede Pittenger, Santa Barbara, CA (US);
Shuiqing Hu, Santa Barbara, CA (US);
Assignee:
Bruker Nano, Inc., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/10 (2010.01); G01Q 30/00 (2010.01); G01Q 30/04 (2010.01); B82Y 35/00 (2011.01); G01Q 60/34 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/00 (2013.01); G01Q 30/04 (2013.01); B82Y 35/00 (2013.01); G01Q 60/34 (2013.01);
Abstract
An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.