Leendert Jan Karssemeijer

Title: Innovator Spotlight: Leendert Jan Karssemeijer

Introduction

Meet Leendert Jan Karssemeijer, an innovative inventor known for his groundbreaking work in metrology methods and lithographic apparatuses. Hailing from 's Hertogenbosch, NL, Karssemeijer holds one significant patent and is affiliated with the esteemed company ASML Netherlands B.V.

Latest Patents

Karssemeijer's notable patent is titled "Metrology method and associated metrology and lithographic apparatuses." This revolutionary method focuses on measuring structures on substrates, particularly those subject to asymmetric deviations. By obtaining intensity asymmetry values and determining phase offset values, Karssemeijer's method allows for precise measurement corrections in such structures.

Career Highlights

Within the realm of innovations, Karssemeijer has made a profound impact through his work at ASML Netherlands B.V. His dedication to developing advanced metrology methods has set new standards in the industry and propelled technological advancements in lithographic apparatuses.

Collaborations

Karssemeijer has collaborated with notable colleagues at ASML Netherlands B.V., including Patricius Aloysius Jacobus Tinnemans and Igor Matheus Petronella Aarts. Together, they have contributed to the innovation and refinement of metrology techniques, further solidifying Karssemeijer's reputation as a pioneering inventor.

Conclusion

In conclusion, Leendert Jan Karssemeijer's innovative contributions to metrology methods and lithographic apparatuses have reshaped the landscape of precision measurement in the industry. His patent stands as a testament to his ingenuity and expertise, making him a leading figure in the world of inventions and innovations.