Essex, VT, United States of America

Leah M P Pastel

This inventor holds 20 USPTO granted patents, primarily in Semiconductor Defect Analysis. Top assignee: International Business Machines Corporation. Active years: 2004-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Leah M P Pastel. Retrieved from https://idiyas.com/inventor/leah-m-p-pastel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 10.0

Average Co-Inventor Count = 4.2

ph-index = 7

Forward Citations = 153(Granted Patents)


Location History:

  • Essex Junction, VT (US) (2004 - 2009)
  • Essex, VT (US) (2004 - 2013)

Company Filing History:


Years Active: 2004-2013

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Areas of Expertise:
Defect Diagnosis
Integrated Circuits
Carbon Nanotube Sensors
Fault Isolation
VLSI Manufacturing
Test Coverage
Diagnostic Coverage
Voltage Islands
Chip Personalization
Failure Analysis
Scan Chains
Manufacturability
20 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Leah M P Pastel

Introduction

Leah M P Pastel, an accomplished inventor residing in Essex, Vermont, has made significant contributions to the field of semiconductor technology. With a remarkable portfolio of 20 patents, Leah has been at the forefront of innovative practices in integrated circuit design and failure identification methodologies.

Latest Patents

Leah's latest innovations include two pivotal patents. The first patent, titled "Bit failure signature identification," presents a comprehensive method, system, and program for identifying bit failures among semiconductor chips. This invention enhances the process of determining the most commonly failing bits and establishing bit failure signatures, thereby improving reliability and efficiency in semiconductor manufacturing.

The second patent focuses on "Method of designing an integrated circuit based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage." This invention outlines an integrated circuit design method that incorporates design-for-manufacturability (DFM) modifications based on test coverage. The iterative approach allows for optimizing design layouts considering both manufacturability and test coverage, significantly contributing to advancements in integrated circuits.

Career Highlights

Leah M P Pastel works at the prestigious International Business Machines Corporation (IBM), where she has been instrumental in advancing semiconductor technologies. Her extensive experience in research and development has positioned her as a notable inventor in her field. The impact of her inventions is reflected in her growing portfolio of patents and her ongoing commitment to innovation.

Collaborations

Throughout her career, Leah has had the opportunity to collaborate with other talented inventors such as David P Vallett and John Maxwell Cohn. These collaborations have not only fostered creative exchanges but have also resulted in groundbreaking advancements in semiconductor design and diagnostics.

Conclusion

Leah M P Pastel’s contributions to the field of semiconductor technology through her innovative patents highlight her role as a leading inventor. Her dedication to enhancing the efficiency and reliability of integrated circuits continues to propel the industry forward. As a prominent figure at IBM, Leah's work remains influential, paving the way for future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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