The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2008
Filed:
Feb. 20, 2003
Anne E. Gattiker, Austin, TX (US);
Phil Nigh, Williston, VT (US);
Leah M. P. Pastel, Essex, VT (US);
Steven F. Oakland, Colchester, VT (US);
Jody Vanhorn, Underhill, VT (US);
Paul S. Zuchowski, Jericho, VT (US);
Anne E. Gattiker, Austin, TX (US);
Phil Nigh, Williston, VT (US);
Leah M. P. Pastel, Essex, VT (US);
Steven F. Oakland, Colchester, VT (US);
Jody VanHorn, Underhill, VT (US);
Paul S. Zuchowski, Jericho, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A voltage island architecture wherein the source voltage of each voltage island can be independently turned on/off or adjusted during a scan-based test. The architecture includes a plurality of voltage islands (), each powered by a respective island source voltage (VDDI, VDDI), and a testing circuit (), coupled to the voltage islands, and powered by a global source voltage (Vg) that is always on during test, wherein each island source voltage may be independently controlled () during test.