The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Aug. 10, 2004
James W. Adkisson, Jericho, VT (US);
Greg Bazan, Essex Junction, VT (US);
John M. Cohn, Richmond, VT (US);
Francis Gravel, Westford, VT (US);
Leendert M. Huisman, South Burlington, VT (US);
Phillip J. Nigh, Williston, VT (US);
Leah M. P. Pastel, Essex, VT (US);
Kenneth Rowe, Burlington, VT (US);
Thomas G. Sopchak, Williston, VT (US);
David E. Sweenor, South Burlington, VT (US);
James W. Adkisson, Jericho, VT (US);
Greg Bazan, Essex Junction, VT (US);
John M. Cohn, Richmond, VT (US);
Francis Gravel, Westford, VT (US);
Leendert M. Huisman, South Burlington, VT (US);
Phillip J. Nigh, Williston, VT (US);
Leah M. P. Pastel, Essex, VT (US);
Kenneth Rowe, Burlington, VT (US);
Thomas G. Sopchak, Williston, VT (US);
David E. Sweenor, South Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for defect diagnosis of semiconductor chip. The method comprises the steps of (a) identifying M design structures and N physical characteristics of the circuit design, wherein M and N are positive integers, wherein each design structure of the M design structures is testable as to pass or fail, and wherein each physical characteristic of the N physical characteristics is present in at least one design structure of the M design structures; (b) for each design structure of the M design structures of the circuit design, determining a fail rate and determining whether the fail rate is high or low; and (c) if every design structure of the M design structures in which a physical characteristic of the N physical characteristics is present has a high fail rate, then flagging the physical characteristic as being likely to contain at least a defect.