The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2013
Filed:
Feb. 16, 2010
Thomas D. Furland, Essex Junction, VT (US);
Robert J. Milne, Jr., Jericho, VT (US);
Leah M. P. Pastel, Essex, VT (US);
Kevin W. Stanley, Milton, VT (US);
Robert C. Virun, Essex Junction, VT (US);
Thomas D. Furland, Essex Junction, VT (US);
Robert J. Milne, Jr., Jericho, VT (US);
Leah M. P. Pastel, Essex, VT (US);
Kevin W. Stanley, Milton, VT (US);
Robert C. Virun, Essex Junction, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system, and program product for identifying at least one bit failure among a plurality of semiconductor chips are provided. A first aspect of the invention provides a method of identifying at least one bit failure signature among a plurality of semiconductor chips, the method comprising: counting failures of each failing bit among the plurality of semiconductor chips; determining a most commonly failing bit (MCFB) among the failing bits; establishing a bit failure signature including the MCFB; counting failures of each failing bit on semiconductor chips on which the MCFB fails; determining a next most commonly failing bit (NMCFB) among the failing bits on semiconductor chips on which the MCFB fails; determining whether the NMCFB tends to fail when the MCFB fails; and in response to a determination that the NMCFB tends to fail when the MCFB fails, adding the NMCFB to the bit failure signature.