Kuljit Virk

Title: Kuljit Virk: Innovator in Sample Inspection and Defect Detection

Introduction

Kuljit Virk is a notable inventor based in Fremont, California, recognized for his contributions to the fields of sample inspection and defect detection. With a total of five patents to his name, he has developed innovative systems that enhance the accuracy and efficiency of manufacturing processes.

Latest Patents

One of Kuljit Virk's latest patents is titled "System and method for reducing sample noise using selective markers." This invention discloses a system that includes an illumination source designed to illuminate a sample composed of a multi-layer stack. The stack consists of layers made from a first light transmissive material and a second light reflective material. The top layer features absorptive markers that selectively bind to it, blocking light transmission through the underlying layers. Additionally, photoluminescent markers are incorporated to enhance features of interest on the sample, with detectors configured to capture the emitted photoluminescent signals.

Another significant patent is "Ensemble of deep learning models for defect review in high volume manufacturing." This system provides methods for detecting defects in images of specimens. It includes a computer subsystem that trains an ensemble of deep learning models by adjusting parameters until a pseudo-loss function is minimized. The trained ensemble is then utilized to detect defects in real-time specimen images, generating labels that indicate the presence of defects based on the outputs of the models.

Career Highlights

Kuljit Virk has worked with prominent companies in the technology sector, including KLA Corporation and KLA-Tencor Corporation. His experience in these organizations has contributed to his expertise in developing advanced inspection systems and defect detection methodologies.

Collaborations

Kuljit has collaborated with notable professionals in his field, including Abdurrahman Sezginer and Lawrence Muray. These collaborations have likely enriched his work and contributed to the success of his innovative projects.

Conclusion

Kuljit Virk's contributions to the fields of sample inspection and defect detection through his innovative patents demonstrate his significant impact on manufacturing technology. His work continues to influence advancements in these critical areas.