Company Filing History:
Years Active: 2015-2022
Title: The Innovative Contributions of Kotoko Urano
Introduction
Kotoko Urano is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of measurement systems and charged particle beam devices. With a total of seven patents to her name, her work has advanced the capabilities of various measurement technologies.
Latest Patents
Urano's latest patents include a measurement system and method for setting observation conditions of measurement apparatus. This innovative system comprises a measurement apparatus that observes a sample based on specific observation conditions, which include various parameters. The system features an observation condition database that stores data related to the sample and the observation conditions. It is designed to calculate and present candidate observation conditions for effective sample observation.
Another notable patent is her work on a charged particle beam device and an aberration correction method for such devices. This invention utilizes a multi-pole type aberration corrector and includes a charged particle source that generates a primary charged particle beam. The device is equipped with an aberration correction optical system that corrects any aberrations in the primary beam, ensuring high-quality imaging of the sample.
Career Highlights
Throughout her career, Urano has worked with esteemed companies such as Hitachi High-Technologies Corporation and Hitachi, Ltd. Her experience in these organizations has allowed her to develop and refine her innovative ideas, contributing to advancements in technology.
Collaborations
Urano has collaborated with notable colleagues, including Tomonori Nakano and Zhaohui Cheng. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.
Conclusion
Kotoko Urano's contributions to the fields of measurement systems and charged particle beam devices highlight her innovative spirit and dedication to advancing technology. Her patents reflect her expertise and commitment to improving measurement techniques, making her a significant figure in her field.
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