Kuwana Mie, Japan

Kiminori Yoshino

USPTO Granted Patents = 5 

Average Co-Inventor Count = 1.7

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Kuwana Mie, JP (2020 - 2021)
  • Kuwana, JP (2021)

Company Filing History:


Years Active: 2020-2024

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5 patents (USPTO):Explore Patents

Title: The Innovations of Kiminori Yoshino

Introduction

Kiminori Yoshino, an accomplished inventor from Kuwana Mie, Japan, has made significant contributions to the field of technology through his innovative patents. With a portfolio that includes five notable inventions, Yoshino has demonstrated a commitment to advancing techniques related to semiconductor technology and measurement systems.

Latest Patents

Among Yoshino's latest patents is a groundbreaking modeling method focused on shape approximation for measurement targets. This method involves utilizing boundary lines and statistical tolerances to accurately represent the shape of measurement targets within structures that have a stack configuration. Another significant invention is his semiconductor defect inspection apparatus, which features an object-under-examination stage, an X-ray irradiation unit, an imaging unit, and a defect detection unit. This apparatus allows for the identification of defects in semiconductor materials through a combination of transmission X-ray imaging and analysis of emitted fluorescent X-rays.

Career Highlights

Throughout his career, Kiminori Yoshino has worked with respected institutions such as Toshiba Memory Corporation and Kioxia Corporation, where he has harnessed his expertise to drive innovative solutions in semiconductor technology. His inventions have played a crucial role in enhancing defect detection and measurement systems, which are vital for ensuring the quality and efficiency of semiconductor production.

Collaborations

Yoshino has collaborated with notable coworkers like Takahito Nishimura and Yoshihisa Kawamura, contributing to enriching discussions and advancements in their shared areas of expertise. These collaborations have undoubtedly furthered his innovative work and brought new perspectives to his projects.

Conclusion

Kiminori Yoshino's contributions to the field of technology highlight the importance of innovation in addressing complex challenges within the semiconductor industry. His patents reflect a deep understanding of both theoretical and practical aspects of measurement and defect detection, positioning him as a valuable inventor in contemporary technological advancements. As the industry continues to evolve, Yoshino's work will likely remain influential in shaping future developments.

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