Company Filing History:
Years Active: 2018-2021
Title: Keiko Kaneda: Innovator in Semiconductor Technology
Introduction
Keiko Kaneda is a prominent inventor based in Chiba, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 3 patents. His work focuses on developing advanced testing apparatuses and semiconductor devices that enhance performance and reliability.
Latest Patents
One of Kaneda's latest patents is a testing apparatus designed to improve the efficiency of semiconductor testing. This apparatus includes a chamber, a probe card with exposed probes, and a stage that supports a test target object. The moving mechanism allows the stage to transition between a testing position and a cleaning position, while an air tube introduces dry air into the chamber to maintain optimal conditions.
Another notable patent is for a semiconductor memory device that features an n-type source/drain within a p-type active region. This device includes a withstand voltage improvement layer that enhances the maximum withstand voltage value of the transistor. By diffusing n-type impurities and applying a withstand voltage improvement voltage, the depletion layer is expanded to reach the source/drain, thereby increasing the device's reliability.
Career Highlights
Keiko Kaneda is currently employed at Toshiba Memory Corporation, where he continues to innovate in the semiconductor field. His work has been instrumental in advancing the technology used in memory devices, contributing to the overall progress of the industry.
Collaborations
Throughout his career, Kaneda has collaborated with talented individuals such as Tomoko Fujiwara and Takao Sueyama. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Keiko Kaneda's contributions to semiconductor technology through his patents and work at Toshiba Memory Corporation highlight his role as a key innovator in the field. His inventions not only improve testing methods but also enhance the performance of semiconductor devices, showcasing the importance of innovation in technology.