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Kazuhiro Sakaguchi

USPTO Granted Patents = 21 (Patent Applications = 2)

Average Co-Inventor Count = 1.1

ph-index = 8

Forward Citations = 137(Granted Patents)

Location History:

Yokosuka, JP (2011)
Kanagawa, JP (2003 - 2014)
Tokyo, JP (1997 - 2023)

Company Filing History:

Nec Electronics Corporation

patents

3 out of 90,697

Canon Kabushiki Kaisha

patents

4. 2 out of 7,525

Renesas Electronics Corporation

patents

where one patent can have more than one assignee

Years Active: 1997-2023

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21 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11714106 - Test apparatus, test method and recording medium (2023-08-01),

2. 8878561 - Screening method, screening device and program (2014-11-04),

3. 8011011 - Method and apparatus for processing data (2011-08-30),

4. 7970817 - Information processing device, information processing method, and control program (2011-06-28),

5. 7483799 - Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor (2009-01-27),

6. 6996489 - Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor (2006-02-07),

7. 6973395 - Observation and/or failure inspection apparatus, method and program therefor (2005-12-06),

8. 6931336 - Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same (2005-08-16),

9. 6766485 - Integrated circuit fault tester, integrated circuit fault test method and recording medium recorded with fault test control program (2004-07-20),

10. 6704675 - Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same (2004-03-09),

11. 6694274 - Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same (2004-02-17),

12. 6684170 - Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same (2004-01-27),

13. 6510289 - Image formation system, control method of image formation system, image formation apparatus and storage medium thereof (2003-01-21),

14. 6480011 - Screening of semiconductor integrated circuit devices (2002-11-12),

15. 6351835 - High speed LSI spectral analysis testing apparatus and method (2002-02-26),

Title: **Kazuhiro Sakaguchi: Innovator in Semiconductor Testing Technologies**

Introduction

Kazuhiro Sakaguchi, based in Tokyo, Japan, is a prominent inventor known for his significant contributions to semiconductor testing technologies. With a remarkable portfolio of 21 patents, he has dedicated his career to enhancing the efficiency and accuracy of semiconductor device testing.

Latest Patents

Sakaguchi's latest innovations include a "Test Apparatus, Test Method and Recording Medium," designed to improve the testing efficiency of semiconductor devices. This apparatus features a probe card with multiple measurement sites that interact with semiconductor devices on a wafer. It incorporates a control unit that generates vital map, probe-card form, and contact-position information, thereby optimizing the testing process.

Another notable patent is the "Screening Method, Screening Device and Program," aimed at detecting defective semiconductor products with high accuracy. This method measures electrical characteristic values of various devices on a wafer and corrects these values by subtracting surface variation components. This meticulous approach leads to more precise detection of outlier semiconductor devices, ensuring heightened reliability in production.

Career Highlights

Throughout his career, Kazuhiro Sakaguchi has worked with major companies, including NEC Corporation and NEC Electronics Corporation. His tenure at these organizations allowed him to develop and refine his innovative ideas in semiconductor technology. His focus on creating solutions that streamline testing processes has cemented his reputation as a key player in the field.

Collaborations

Sakaguchi has had the opportunity to collaborate with esteemed colleagues such as Tadashi Hagiuda and Masao Hayashi. These partnerships have enabled the exchange of ideas and knowledge, further advancing the state of semiconductor testing technologies.

Conclusion

Kazuhiro Sakaguchi's contributions to the realm of semiconductor testing exemplify the importance of innovation in technology. His patents not only enhance the efficiency of device testing but also ensure production quality. As he continues to push boundaries in semiconductor technology, his work will undoubtedly leave a lasting impact on the industry.

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